Event Scheduled for Sep 14, 2018
Event: MSE Seminar Speaker - Dr. Nathan D. Orloff
Time: 09:45 am
Details of Event:
The Materials Science and Engineering department invites you to a seminar by
Dr. Nathan D. Orloff
Microwave Materials Project Leader, Communications Technology Laboratory, National Institute of Standards and Technology, Colorado
Friday, September 14, 2018
Institute of Materials Science Building, Room 20, at 9:45 a.m.
Refreshments will be served at 9:30 a.m.
“Microwave Materials at NIST”
Abstract: Microwave measurements reveal information about a materials behavior in electromagnetic fields, which can be related to important characteristics such as composition and reactivity. For chemical manufacturers and the pharmaceutical industry, such measurements can be used for quality assurance or to monitor various electrical, chemical, and mechanical processes. For ceramic and thin-film applications, broadband electrical properties are essential for modeling nonlinearities that limit the energy efficiency of electronics. To advance the state-of-the-art in electrical property measurement, NIST has developed a suite of tools for measuring materials1, which includes new techniques for fluids2, nonlinear dielectrics, and carbon-fiber composites. Here, I will review our prior work and present our current approach for materials metrology. I will provide a detailed summary of our fabrication procedures, including design considerations and constraints. Finally, I will conclude with potential roadmap for future materials metrology at NIST.
1. C.-H. Lee, N. D. Orloff, T. Birol, et al. Exploiting dimensionality and defect mitigation to create tunable microwave dielectrics. Nature 502, 532–536 (2013).
2. C. A. E. Little, N. D. Orloff, et al. Modeling electrical double-layer effects for microfluidic impedance spectroscopy from 100 kHz to 110 GHz. Lab. Chip 17, 2674–2681 (2017).
Bio: Nathan (Nate) D. Orloff received the B.S. degree in physics with high honors and Ph.D. degree in physics from the University of Maryland at College Park, College Park, MD, USA, in 2004 and 2010, respectively. His doctoral thesis concerned the study and measurement of microwave properties of Ruddelsden-Popper ferroelectrics.
In 2011, he was a Dean’s Postdoctoral Fellow with the Department of Bioengineering, Stanford University. In 2013, he joined the Materials Measurement Laboratory, National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA, as a Rice University Postdoctoral Fellow. In 2016, he joined the Communications Technology Laboratory at NIST in Boulder Colorado. Dr. Orloff was the recipient of the 2004 Martin Monroe Undergraduate Research Award, the 2006 Dean's Award for Excellence as a Teaching Assistant, the 2010 Michael J. Pelczar Award for Excellence in Graduate Study, the 2014 Distinguished Associate at NIST, and is a Senior Member of the IEEE. He has published more than forty peer-reviewed articles and proceedings. He holds a U.S. Patent on measuring material properties in roll-to-roll manufacturing. Dr. Orloff is currently the Project Leader of the Microwave Materials Project in the Communications Technology Laboratory at NIST in Boulder, Colorado.
Target Audience: Not Available
Sponsored By: Materials Science and Engineering Department
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