Professional Activities

  • Panelist, WRTLT, Sapporo, Japan, Nov. 2008.

  • Panel Organizer, Title: Zero Defect (Zero DPPM): How can we get there?,  Int. Symposium on Defect and Fault Tolerance in VLSI Systems (DFT), Oct. 2008

  • Panel Co-organizer, Title: Challenges in Test Data Collection and Analysis, Int. Workshop on  Defect and Data Driven Testing, (D3T), Oct. 2008

  • Program Chair, IEEE Workshop on Defect and Data Driven Testing (D3T), 2008, Santa Clara, CA

  • Co-Program Chair, International Symposium on Defect and Fault Tolerance of VLSI Systems (DFT), 2008, Boston, MA

  • Steering Committee Chair, IEEE International Workshop on Hardware-Oriented Security and Trust (HOST)

  • General Chair, 1st IEEE International Workshop on Hardware-Oriented Security and Trust (HOST), 2008

  • Program Chair, IEEE Workshop on Defect Based Testing (DBT), 2007, Santa Clara, CA

  • Associate Editor, Journal of Electronic Testing: Theory and Applications (JETTA), 2007-present

  • Editor, TTTC News Letter

  • Guest Editor, Special issue on "Test, Defect Tolerance, and Reliability of Nanoscale Devices", Journal of Electronic Testing: Theory and Applications (JETTA)

  • Guest Editor, Special issue on "IR-Drop and power Supply Noise Effects on Design and Tetst of Very Deep Submicron Designs", IEEE Design & Test of Computers, Guest Co-editor: Ken Butler (Texas Instruments)

  • Panel Co-organizer (with Kee Sup Kim from Intel), Title: Three Questions to Oracle (Data required for test engineers and researchers in academia), IEEE VLSI Test Symposium (VTS), 2006

  • Panel Co-organizer (with Hank Walker, Texas A&M University), Title: Process Variations + Systematic Defects: Can DBT Help? , International Workshop on Defect-Based Testing (DBT), 2007.

  • Proposal reviewer and panelist for the National Science Foundation (NSF), 2005, 2006

  • Senior Member, IEEE

  • Member, ACM, ACM SIGDA, TTTC

  • Member, TTTC Middle East and Africa Group

  • Member, Program Committee, ACM SIGDA Ph.D. DAC Forum, 2008

  • Member, Program Committee, IEEE Workshop on RTL and High Level Testing (WRTLT), 2009

  • Member, Program Committee, ACM Great Lake Symposium on VLSI (GLSVLSI), 2009

  • Member, Program Committee, International Conference on Communication Theory, Reliability, and Quality of Service (CTRQ), 2008-present

  • Member, Program Committee, IEEE Int. Workshop on Defect Based Testing (DBT), 2005-present

  • Member, Program Committee, Int. Conference on Computer Design (ICCD), 2008.

  • Member, Program Committee, North Atlantic Test Workshop (NATW) 2004-present

  • Member, Program Committee, IEEE Int. Symp. on Defect and Fault Tolerance in VLSI Systems (DFT ), 2005, 2006, 2007

  • Member, Program Committee, International Design and Test Workshop (IDT), 2006, 2007

  • Member, Program Committee, International Symposium on Nanoscale Architectures (NanoArch), 2007, 2008

  • Member, Program Committee, IEEE Int. On-Line Testing Symposium (IOLTS), 2009

  • Local Arrangement Chair, IEEE Int. Symp. on Defect and Fault Tolerance in VLSI Systems (DFT), 2006

  • Session Chair, Int. Workshop on Current and Defect-Based Testing (DBT'05)

  • Session Chair, IEEE North Atlantic Test Workshop (NATW'06)

  • Session Chair, International Test Conference (ITC'06)

  • Session Chair, International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'06)

  • Session Chair, Design Automation Conference (DAC'07)

  • Session Chair, International Symposium on Nanoscale Architectures (NanoArch), 2008

  • Session Chair, IEEE North Atlantic Test Workshop (NATW'08)

  • Session Chair, International Test Conference (ITC'08)

  • Session Chair, IEEE Workshop on RTL and High Level Testing (WRTLT'08)

Selected Review Activities:

·          National Science Foundation (NSF)

·          International Test Conference (ITC)

·          IBM Journal of Research and Development

·          ACM Journal on Emerging Technologies in Computing Systems (JETC)

·          IEEE Transactions on Computer-Aided Design of of Integrated Circuits and Systems

·          IEEE Transactions on Very Large Scale Integration Systems

·          IEEE Transactions on Computers

·          ACM Transactions on Design Automation of Electronic Systems (TODAES)

·          Journal of Electronic Testing: Theory and Applications (JETTA)

·          IEEE North Atlantic Test Workshop (NATW)

·          IEEE Communication Magazine

·          IEEE VLSI Test Symposium (VTS)

·          International Conference on Microelectronics (ICM)

·          International Journal of Computers and Applications

·          IEEE Asian Test Symposium (ATS)

·          Design Automation Conference (DAC)