In the name of God

 

 

Mohammad Tehranipoor, PhD   Assistant Professor Electrical and Computer Engineering Department University of Connecticut   Email: tehrani at engr dot uconn dot edu URL: http://www.engr.uconn.edu/~tehrani

 

 

Research Interests:

Computer-Aided Design and Test, Design-for-Testability (DFT), Delay Fault Testing, Test Resource Partitioning, Secure Design, IC Trust, and CAD, Test and Defect Tolerance for Nanoscale Devices.

 

    Major News:

• Invited Talk, IBM TJ Watson, Nov. 2008, Host: Dr. Jinjun Xiong

• Invited Talk, Intel, Nov. 2008, Title: Small Delay Fault Detection and On-Chip Measurement

• Invited Talk, FIST, Japan, Dec. 2008, Title: Dealing with Power and Signal Integrity Issues During Test in Nanometer Technology Designs

• Invited Talk, Fukuoka Industry, Science & Technology Foundation (FIST), Japan, Dec. 2008, Title: Verifying Trustworthiness of Integrated Circuits

• Panelist, WRTLT, Sapporo, Japan, Nov. 2008.

• Invited Talk, IEEE Workshop on Design for Reliability and Variability (DRV), Oct. 2008, Title: ATPG for Increased Quality and In-Field Reliability

• Panel Co-organizer, Title: Challenges in Test Data Collection and Analysis, Int. Workshop on  Defect and Data Driven Testing, (D3T), Oct. 2008

• Panel Organizer, Title: Zero Defect (Zero DPPM): How can we get there?,  Int. Symposium on Defect and Fault Tolerance in VLSI Systems (DFT), Oct. 2008

• Invited Talk, IBM, Aug. 2008, Invited by: Dr. Phil Nigh

• Tutorial, Aug. 12, 2008, MWSCAS, Title: High-Quality Delay Tests for Nanometer Technology Designs

• Program Chair, IEEE Workshop on Defect and Data Driven Testing (D3T), 2008

• Editor, TTTC Newsletter

• Co-Program Chair, International Symposium on Defect and Fault Tolerance of VLSI Systems (DFT), 2008, will be held in Boston, MA

• Invited Talk, Magma, April 2008, Host: Dr. Sandeep Goel

• Invited Speaker, SRC e-Workshop, Feb. 2008, Title: High-Quality Delay Tests for Nanotechnology Designs

• Steering Committee Chair, IEEE International Workshop on Hardware-Oriented Security and Trust (HOST)

• General Chair, 1^st IEEE International Workshop on Hardware-Oriented Security and Trust (HOST), 2008

• Associate Editor, Journal of Electronic Testing: Theory and Applications (JETTA)

• Invited Talk, Freescale, Austin, TX, Dec. 2007, Host: Dr. Magdy Abadir/Dr. Raj Raina

• Invited Talk, Texas Instruments, Dallas, TX, Dec. 2007, Hosts: Vinay Jayaram / Dr. Ken Butler

• Invited Talk, TranSwitch, Bedford, MA, Nov. 2007, Host: Zahi Abuhamdeh

• Invited Talk, AMD, Boston, MA, Nov. 2007, Host: Dr. Kamran Zarrineh

• Invited Talk, Analog Devices, Boston, MA, Nov. 2007, Host: Harry Chen

• Guest Speaker, Magma's Luncheon Event at International Test Conference (ITC), San Jose, CA, Tuesday Oct. 23, 2007.

    Current Students:

• Jeremy Lee, PhD Student (M.S., University of Connecticut)

• Xiaoxiao (Michel) Wang, PhD Student (B.S. and M.S., Beihang University)

• Ke Peng, PhD Student (M.S., Chinese Academy of Science)

• Junxia Ma, PhD Student (B.S., Beihang University, M.S. Macao University)

• Hassan Salmani, PhD Student (M.S., Sharif University of Technology)

• Jason Thibodeau, MS Student (B.S., University of Connecticut)

 

    Graduated Students:

• Nisar Ahmed, PhD, Sep 2007, Thesis Title: High Quality Delay Tests for Very Deep Submicron Designs, Currently with Texas Instruments

• Prasath Periasamy, M.S., Aug 2006, Thesis Title: Pattern Generation to Induce Maximum Power Supply Noise Using Timing and Current Based Analysis, Currently with Qualcomm

• Mohammed ElShoukry, M.S., Aug 2006, Thesis Title: Power Reduction During Test Using Partial Gating, Currently with Micron

• Smita Patil, M.S., Aug 2006, Title: Monitoring Switching Activity during At-speed Test, Currently with Atmel

• Eun Chung, M.S., Dec. 2004, Title: Process Variation Effects on Leakage Current

• Pedro Almaida, B.S.

    Awards:   

• IEEE Computer Society Meritorious Service Award, 2008

• Best Paper Award, IEEE North Atlantic Test Workshop (NATW), 2008

• Honorable Mention for Best Paper Award, IEEE North Atlantic Test Workshop (NATW), 2008

• My PhD student, Jeremy Lee, received the TTTC Best Thesis Research Poster Award, 2008

• My PhD student, Jeremy Lee, received the Best Computer Engineering Seminar Presentation, 2008

• Best Panel Award, IEEE VLSI Test Symposium (VTS), 2006

• My PhD student, Nisar Ahmed, received the TTTC 2007 Best Doctoral Dissertation Award

• Best Paper Award, IEEE VLSI Test Symposium (VTS), 2005

• Best Paper Candidate, Design Automation Conference (DAC), 2006

• My PhD student, Nisar Ahmed, received the UMBC-CSEE's Best PhD Thesis Award, 2006

• Best Paper Candidate, Texas Instruments Symposium on Test (TIST), 2005

• Top Ten Paper recognition, International Test Conference (ITC), 2005

    Project Supports:   

• Semiconductor Research Corporation (SRC)

• Texas Instruments

• National Science Foundation (NSF), Cyber Trust

• National Science Foundation, CPA

• National Science Foundation, GOALI

• Intel Equipment Grant

• UConn Research Foundation

• UMBC RAS/RIS

    Publications          Professional Activities          Resume          Invited Talks         CADT Lab

    Teaching:

• ECE 290/291: Senior Design (Fall 2006, Spring 2007, Fall 2007, Spring 2008)   

• ECE 300: VLSI Design Verification and Testing (Spring 2007, Spring 2008)

• ECE 6095: CAD Algorithms (Fall 2008)

• ECE 6094: Computer Engineering Seminar (Fall/Spring 2008)     

    Contact Information:

        Room: ITE 441

        Electrical and Computer Engineering
        University of Connecticut

        371 Fairfield Way, Unit 2157

        Storrs, CT 06269-2157
        Email: tehrani at engr dot uconn dot edu

        Phone: 860-486-3471

        Fax: 860-486-2447