In the name of God

 

 

Mohammad Tehranipoor, PhD

Assistant Professor

Director, Computer-Aided Design and Test Research Lab

Director, Secure and Trustable Systems Lab

Co-founder, International Symposium on Hardware-Oriented Security and Trust (HOST)

 

Email: tehrani at engr dot uconn dot edu

URL: http://www.engr.uconn.edu/~tehrani

Publications

Professional Activities

Invited Talks

Resume

CADT Research Lab

STS Lab

HOST Symposium

ECE Department

University of Connecticut

 

 

Research Interests:

Computer-Aided Design and Test

Design-for-Testability (DFT)

Delay Fault Testing

Reliability Analysis

Secure IP/IC Design

Hardware Security and Trust

CAD, Test and Defect Tolerance for Nanoscale Devices.

    Major News:

  • Tutorial, Design, Automation, and Test in Europe (DATE), 2010, Testing Low-Power Integrated Circuits: Challenges, Solutions, and Industry Practices, Srivaths Ravi (Texas Instruments), Mohammad Tehranipoor (UConn), Rohit Kapur (Synopsys)

  • UConn Robust Design Workshop, Design for Reliability from ASIC to System, April 2010.

  • Invited Talk, University of Massachusetts, Lowell, HOST: Prof. Martin Margala

  • Associate Editor, Journal of Low Power Electronics (JOLPE)

  • Invited Talk, LSI Logic, Jan 2010, HOST: Dr. Sreejit Chakravarty

  • Invited Talk, Information Security Council (INFOSEC), Jan 2010

  • Invited Talk, IBM-Austin Research Lab (IBM-ARL), Nov. 2009, HOST: Dr. Anne Gattiker

  • ARO Special Workshop on Hardware Assurance, 2009

  • Associate Editor, IEEE Design & Test of Computers

  • Guest Editor, IEEE Design & Test Special Issue on "Verifying Physical Trustworthiness of Integrated Circuits and Systems", Guest Editors: Mohammad Tehranipoor (UConn) and Farinaz Koushanfar (Rice University), 2009

  • Program Chair, ARO Special Workshop on Hardware Assurance, UConn, August 2009

  • International Conference on VLSI, 2009, High-Quality and Low-Cost Delay Testing for VDSM Designs: Challenges & Solutions, Mohammad Tehranipoor (UConn) and Krish Chakrabarty (Duke University)

  • Panelist, International Test Conference (ITC), Nov. 2009, Austin, TX

    Current Students:

  • Jeremy Lee, PhD Student (M.S., University of Connecticut), Currently with Texas Instruments

  • Xiaoxiao (Michel) Wang, PhD Student (B.S. and M.S., Beihang University)

  • Ke Peng, PhD Student (M.S., Chinese Academy of Science)

  • Junxia Ma, PhD Student (B.S., Beihang University, M.S. University of Macau)

  • Hassan Salmani, PhD Student (M.S., Sharif University of Technology)

  • Jason Thibodeau, PhD Student (B.S., University of Connecticut)

  • Wei Zhao, PhD Student (B.S. and M.S., Huazhong University)

  • Xuehui Zhang, PhD Student (B.S. and M.S., Beihang University)

  • Niranjan Kayam, PhD Student (M.S., Manipal University)

  • Fang Bao, PhD Student (M.S., Beijing Microelectronics Technology Institute)

  • Jifeng Chen, PhD student (M.S., University of Arizona, B.S. and M.S., Xidian University)

    Graduated Students:

  • Nisar Ahmed, PhD, Sep 2007, Thesis Title: High Quality Delay Tests for Very Deep Submicron Designs, Currently with Texas Instruments

  • Prasath Periasamy, M.S., Aug 2006, Thesis Title: Pattern Generation to Induce Maximum Power Supply Noise Using Timing and Current Based Analysis, Currently with Qualcomm

  • Mohammed ElShoukry, M.S., Aug 2006, Thesis Title: Power Reduction During Test Using Partial Gating, Currently with Micron

  • Smita Patil, M.S., Aug 2006, Title: Monitoring Switching Activity during At-speed Test, Currently with Atmel

  • Eun Chung, M.S., Dec. 2004, Title: Process Variation Effects on Leakage Current

  • Pedro Almaida, B.S.

    Awards:   

  • ECE Department Research Excellence Award, 2009

  • Best Paper Award, IEEE North Atlantic Test Workshop (NATW), 2009

  • National Science Foundation CAREER Award, 2009

  • IEEE Computer Society Meritorious Service Award, 2008

  • Best Paper Award, IEEE North Atlantic Test Workshop (NATW), 2008

  • Honorable Mention for Best Paper Award, IEEE North Atlantic Test Workshop (NATW), 2008

  • Best Panel Award, IEEE VLSI Test Symposium (VTS), 2006

  • Best Paper Award, IEEE VLSI Test Symposium (VTS), 2005

  • Best Paper Candidate, Design Automation Conference (DAC), 2006

  • Best Paper Candidate, Texas Instruments Symposium on Test (TIST), 2005

  • Top Ten Paper recognition, International Test Conference (ITC), 2005

  • Student Awards:

  • Junxia Ma: Received Best in Session Award at TECHCON 2009

  • Jeremy Lee: Received the TTTC Best Thesis Research Poster Award, 2008

  • Jeremy Lee: Received the Best Computer Engineering Seminar Presentation, 2008

  • Nisar Ahmed: received the TTTC 2007 Best Doctoral Dissertation Award

  • Nisar Ahmed: received the UMBC-CSEE's Best PhD Thesis Award, 2006

    Project Supports:   

  • Semiconductor Research Corporation (SRC)

  • Texas Instruments

  • Mentor Graphics

  • National Science Foundation, CAREER Award

  • National Science Foundation, Cyber Trust

  • National Science Foundation, CPA

  • National Science Foundation, GOALI

  • Intel Equipment Grant

  • LSI Logic Corporation

  • Freescale Semiconductor

  • GANN, Department of Education

  • UConn Research Foundation

  • UMBC RAS/RIS

    Teaching:

    Contact Information:

        Room: ITE 441

        Electrical and Computer Engineering
        University of Connecticut

        371 Fairfield Way, Unit 2157

        Storrs, CT 06269-2157
        Email: tehrani at engr dot uconn dot edu

        Phone: 860-486-3471

        Fax: 860-486-2447