The Huey AFM Labs emphasizes the development and application of novel scanning probe microscopy methods for nanoscale materials property characterization, mapping, and manipulation. Materials studied include ferroelectric thin films, ZnO sensors, traditional semiconductors, metal alloys, insects, and individual living mammalian cells. Efforts are also underway to develop virtual-reality based 3-dimensional data visualization and experiential educational materials. The group collaborates with local and international researchers in the fields of Education, Physics, Chemistry, Mechanical Engineering, Chemical Engineering, Electrical Engineering, Biology, and Medicine.

For more information, please see the group website or the NanoMeasurement Labs facility website.