Event Scheduled for Feb 1, 2013
Event: ECE - Systems Seminar - Manufacturing Cyber-Physical Systems - presented by Hui Wang, University of Michigan
Location: Information Technologies Engineering Building, room 336
Time: 01:00 pm
Details of Event:
Please join us at
ECE - Systems Seminar
February 1, 2013 1:00 P.M.
Reception begins at 12:30 P.M.
Manufacturing Cyber-Physical Systems
University of Michigan
Abstract: This talk presents a research vision for establishing manufacturing cyber-physical systems (MCPS) and preliminary results in various applications. The envisioned MCPS focuses on building a network of interacting elements in manufacturing systems to enhance system repeatability and throughput under dynamic environment with process variations, operator interventions, and product demand changes. One key aspect of MCPS research is to conduct modeling of interactions/interfaces among multiple elements in manufacturing systems by integrating computational methods and system data with process physics knowledge to establish information fusion models. This presentation focuses on information fusion models and their applications in surface variation monitoring and control for high-precision machining using big data. Research visions and results in other applications in on-demand MCPS for product variety and personalization as well as process control for micro/nano quality characteristics will also be briefly presented. This talk concludes with a research plan on MCPS, collaboration, and funding opportunities.
Bio: Hui Wang received his B.S. degree in mechanical engineering from Shanghai Jiao Tong University, Shanghai, China, in 2001, an M.S.E. degree in mechanical engineering from the University of Michigan in 2003, and a Ph.D. degree in industrial engineering from the University of South Florida in 2007, respectively. He is currently an assistant research scientist and an intermittent lecturer at the University of Michigan. His research has been focused on manufacturing system design, automation, and process control by integrating applied statistics, image processing, optimization, and control theory with engineering knowledge with broad applications including automotive, energy system, semiconductor, and nano-manufacturing. His research in recent years has been conducted in close collaboration with a metrology company and U.S. manufacturing industries including Ford Motors and General Motors. His research has received the best paper awards from ASME-Manufacturing Science and Engineering Conference and International Conference on Frontiers of Design and Manufacturing and featured article recognition of IIE Transactions. He is a member ASME, IIE, and INFORMS
Target Audience: Open to All
Sponsored By: Electrical and Computer Engineering
No Pamphlet/Flyer Available