Name: Bryan Huey
Title: Associate Professor and Director for Graduate Studies, MSE
Affiliation: Institute of Materials Science
Department: Materials Science & Engineering
Personal/Lab Website: http://hueyafmlabs.mse.uconn.edu/
Program/Department Website: http://www.mse.engr.uconn.edu/bryan-d-huey
Office Telephone: (860) 486-3284
Keywords | Categories: Atomic Force Microscopy, characterization of various nanomaterials and structures, coating, ferroelectrics, high speed AFM and combined AFM/optics, In-situ imaging of micro-electro-mechanical-systems, Institute of Materials Science, Materials Science and Engineering, nanomechanical dynamics of tissue and living cells, nanoparticles, nanoscale performance mapping of photovoltaics, nanotechnology, phase change memory, photovoltaic reliability and accelerated lifetime testing, photovoltaics, piezoactuation of novel piezoelectrics, piezoelectrics, switching dynamics in ferroelectric and multiferroic materials, ultrasonic micro-manipulation, university-industry partnerships
Bryan Huey is a professor and department head in the department of Materials Science and Engineering. Before joining UConn in 2004, Bryan was a postdoc at NIST and Oxford University. He earned his PhD from the University of Pennsylvania and BS from Stanford University.
Bryan’s research focuses on the development and application of novel microscopy methods for measuring and mapping materials properties at the nanoscale. This has included the fastest AFM in the US for high speed studies of dynamic surface properties, simultaneous AFM and 3-d optical fluorescence, and lately pioneering tomographic AFM. He has been honored with a Velux fellowship as a visiting professor to iNano at Aarhus University in Denmark, and the Fulrath award from the American Ceramic Society for research and collaboration with scientists in Japan. Bryan has served as the chair of the Basic Science Division in the American Ceramic Society, and is one of five chairs planning the ~7500 attendee Fall 2019 Materials Research Society conference.